Please enter your information below to register for the webcast.


Spotfire On Demand Webcast:
Big Data Science and Intelligent Manufacturing Part 3 of 3: Yield Improvement with TIBCO Spotfire Analytics

Presented By:
Michael O'Connell, Ph.D., Chief Data Scientist, TIBCO Spotfire
Andrew Choo, Sr. Yield Engineer, TriQuint Semiconductor

Date Recorded:
Thursday, November 21, 2013 

TIBCO Spotfire - Complimentary On Demand Webcast

TriQuint designs, develops and manufactures innovative, highly integrated RF solutions with leading compound semiconductor technologies for communications and defense companies worldwide. 

Device Yield is one of the key metrics in TriQuint’s manufacturing operations, with the goal being to obtain the maximum possible devices from our manufacturing processes which meet quality standards and can be delivered to customers. Yield is a key driver for revenue. When yield problems occur, actions are undertaken to understand the cause of the problems, take corrective actions and implement preventive measures to prevent future occurrences. Understanding yield problems require extraction and analysis of data related to the problem, often times under real time constraints to minimize any realized loss in revenue.  

With a current worldwide license deployment, Spotfire has become the standard data analysis tool at TriQuint and is used by many groups within the company on a wide range of data analysis needs. In this webcast, we will demonstrate how Spotfire is used to analyze yields and provide QA/QC and root cause analysis functionality within TriQuint diesort test operations.

Questions? Please email the Spotfire Team